July 2020: Omer Luria has won the award at the ICMSN 2020 conference for presenting his work on ellipsometric measurements of 2-D monolayers.
This work was later published as a paper in Applied surface Science Journal:
Large-Scale characterization of Two-Dimensional Monolayer MoS2 Island Domains Using Spectroscopic Ellipsometry and Reflectometry
Omer Luria, Pranab Kishore Mohapatra, Avinash Patsha, Abraham Kribus, Ariel Ismach